Reference Number: ARL-SRP-00032

Project Description

Standard processing techniques developed for silicon or wide bandgap materials like GaN typically cannot be one-to-one transferred to ultra-wide bandgap materials like diamond. This project will develop atomic force microscopy (AFM) tools and techniques to characterize processing effects on diamond surfaces. The participant will assemble and qualify AFM capability on a Raman microscope system, enabling correlative spatial mapping measurement between AFM and Raman. We expect that by the project end the participate will enable our team to perform detailed mapping of the morphological and structural characteristics of diamond surfaces altered by different processing treatments. This capability will enable our team to perform root-cause analysis and process optimization based on the results of either AFM or correlative mapping.

Technical Skills

• Materials Engineering
• Physics